Image Enhanced Ellipsometer combines the features
of the Picometer Ellipsometer
and the Imaging
Ellipsometer in a single instrument. This unique
new design is an example of the power and flexibility
of the Modular System. By replacing the arms of
the Optical Table with specially designed arms
featuring twin mounting tracks, both Picometer
and Imaging systems can be operated simultaneously
on the same sample.
While the Imaging system shows either an intensity
or ellipsometric image of the sample, the Picometer
system gives a fast high-sensitivity readout of
the ellipsometry signal at a small spot in the
middle of the image. The user can image a large
area of the sample instantaneously and then pick
a spot in a region of interest for closer examination
with the sensitivity of the Picometer Ellipsometer.
imaging capability greatly simplifies work on
non-uniform samples such as spreading or bursting
drops or corroded surface.
Both the Imaging and the Picometer Ellipsometer
can be upgraded to the Image-Enhanced Ellipsometer.