high speed (2ms response), high sensitivity (1/100 monolayer of oxide on silicon)
single wavelength, single beam ellipsometer based on the Birefringence Modulation
design, for measurements of ultra-thin surface layers. Sensitivity limited by
Photon Shot noise. Illumination areas to as small as 15 microns.
a CCD detector and microscope zoom lens to produce ellipticity images of a surface
in typically 20s. Ideal for inhomogenous or patterned surfaces - sample scanning
is not required.
spectroscopic version of the high speed, high sensitivity Standard Picometer,
covering the wavelength range 250nm to 1700nm (extensions to 200nm are also available).|
low cost version of the Picometer mounted on the lower precision Light Optical
Reflectivity images of the imaged area, useful, for instance, for studying fibre
optic anti-reflection coatings on small fibre-optic surfaces.
components can be mounted in many configurations to suit the customer. The instruments
can be used to study polarised and unpolarised light. Examples: studies of Circular
Dichroism, the distribution of scattered light from rough surfaces, reflection
and transmission by anisotropic crystal, etc.
& Data Analysis
experience and skills of our staff are available to help with your metrology problems
and assist with data analysis. We can also design a system to suit your requirements.