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Solutions - Optoelectronics Metrology

 
 

Many applications in the optoelectronic industry use glass as a substrate, rather than silicon which is commonly used in the semiconductor industry. SiO2 is often used as a low refractive index material in the construction of DW multilayer cavities.

There is very little difference between the refractive indices of the substrate and the layer, so that reflectivities are very small.

The Picometer has very high sensitivity, and has the sensitivity to study these low contrast interfaces.

The high speed of the Picometer makes it ideal for incorporation into the fab process.

The Imaging Ellipsometer is able to image the cut and coated ends of individual fibers, and can make spectroscopic ellipticity or reflectivity measurements to confirm antireflection properties.

See Examples and Application notes.

 

 
Semiconductors Semiconductors Chem & Phys Engineering  Chemical Physics & Chemical Engineering
Opto-electronics Opto-electronics Biotechnology  Biotechnology
 
 
 
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